Measurement Technology for Micro-Nanometer Devices

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Measurement Technology for Micro-Nanometer Devices

von

Zhang, WendongChou, XiujianShi, TielinMa, ZongminBao, HaifeiChen, JingChen, LiguoLi, Dachao

E-BookEPUBKopierschutz: DRM, Lesegeräte: PC/MAC/eReader/TabletE-Book

Verkaufsrang71753inTechnik

EUR128,99

Beschreibung

A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale
• Highlights the advanced research work from industry and academia in micro-nano devices test technology
• Written at both introductory and advanced levels, provides the fundamentals and theories
• Focuses on the measurement techniques for characterizing MEMS/NEMS devices
• Companion website includes Lab View soft, micro-vision system test software, and algorithm software, enhancing the learning experience

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